The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
Mar. 15, 2012
Applicants:
Walter Nistico, Berlin, DE;
Jan Hoffmann, Berlin, DE;
Eberhard Schmidt, Kleinmachnow, DE;
Inventors:
Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/113 (2006.01);
U.S. Cl.
CPC ...
A61B 3/14 (2013.01); A61B 3/113 (2013.01);
Abstract
The invention relates to an optical measuring device () for capturing at least one parameter of at least one eye () of a test person () wearing the optical measuring device (), comprising a frame (), which is configured to fix the optical measuring device () to the head of the test person (), at least one capturing unit (), which is configured to optically capture the at least one parameter of the at least one eye (), and an illumination unit () for illuminating the at least one eye (), wherein an illumination characteristic is adjustable by means of the illumination unit ().