The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
Nov. 10, 2009
Hidetaka Hattori, Aichi, JP;
Hideki Horizono, Aichi, JP;
Masayuki Kanemasu, Aichi, JP;
Shigeyuki Matsubara, Osaka, JP;
Kunihiko Shinoda, Osaka, JP;
Hirotoshi Hujigaki, Osaka, JP;
Susumu Ryuuou, Osaka, JP;
Hidetaka Hattori, Aichi, JP;
Hideki Horizono, Aichi, JP;
Masayuki Kanemasu, Aichi, JP;
Shigeyuki Matsubara, Osaka, JP;
Kunihiko Shinoda, Osaka, JP;
Hirotoshi Hujigaki, Osaka, JP;
Susumu Ryuuou, Osaka, JP;
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Abstract
A nondestructive inspection apparatus according to the present invention has a transmission-side probe configured to emit a first ultrasonic wave toward a test-target fluid, a plate through which a Lamb wave generated by the first ultrasonic wave is propagated when the first ultrasonic wave is propagated, and a reception-side probe configured to measure intensity of a second ultrasonic wave which is emitted from the plate and propagates through the test-target fluid. At this time, the nondestructive inspection apparatus can inspect the test-target fluid without bringing the transmission-side probe configured to emit the first ultrasonic wave and the reception-side probe configured to measure the second ultrasonic wave into contact with the test-target fluid.