The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9032640 B1

PDF
Full Text
Expired
Date of Patent:
May. 19, 2015

Filed:

Dec. 17, 2012
Applicant:

Physical Optics Corporation, Torrance, CA (US);

Inventors:

David Harold Miller, San Pedro, CA (US);

Christopher Thad Ullmer, San Pedro, CA (US);

Edward Matthew Patton, Torrance, CA (US);

Assignee:

Physical Optics Corporation, Torrance, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/06 (2006.01);
U.S. Cl.
CPC ...
G01B 5/06 (2013.01);
Abstract

A measurement gauge, comprising a pair of jaws biased in a closed position; a normalizing member surrounding one of the jaws when the pair of jaws is closed, the normalizing member biased in an extended position; a handle coupled to the pair of jaws and normalizing member such that movement from an extended handle position to an retracted handle position opens the pair of jaws and moves the normalizing member to an retracted position.


Find Patent Forward Citations

Miller, David. (2015). Self-normalizing panel thickness measurement system (U.S. Patent No. 9032640). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9032640

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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