The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2015
Filed:
May. 17, 2012
Kyle L. Greenwood, Bryan, TX (US);
Chad Ottaberry, Bryan, TX (US);
Kyle L. Greenwood, Bryan, TX (US);
Chad Ottaberry, Bryan, TX (US);
Black Mountain Industries, Inc., Bryan, TX (US);
Abstract
A system and method for inspection and quality control for goods determines whether the goods comply with desired configurations. In an embodiment, an inspection and quality control system for a good includes a template. The template includes a template body and a positive offset. The positive offset includes a maximum length of the good and a maximum width of the good. The positive offset is configured for the good to be disposed in the positive offset when the good is less than the maximum length and the maximum width. The system also includes a negative inset. The negative inset includes a minimum length for the good and a minimum width for the good. The negative inset is configured to be disposed in the positive offset over the good disposed in the positive offset.