The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Sep. 25, 2012
Applicant:
Lsi Corporation, Milpitas, CA (US);
Inventors:
Assignee:
Avago Technologies General IP (Singapore) Pte. Ltd., Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/03 (2006.01); H04L 27/06 (2006.01); H03M 13/05 (2006.01); H03M 13/45 (2006.01); H03M 13/29 (2006.01); H03M 13/11 (2006.01); H03M 13/37 (2006.01); H03M 13/39 (2006.01); H03M 13/25 (2006.01);
U.S. Cl.
CPC ...
H03M 13/05 (2013.01); H03M 13/458 (2013.01); H03M 13/2948 (2013.01); H03M 13/1108 (2013.01); H03M 13/3746 (2013.01); H03M 13/2975 (2013.01); H03M 13/3927 (2013.01); H03M 13/2927 (2013.01); H03M 13/2957 (2013.01); H03M 13/258 (2013.01); H03M 13/1125 (2013.01); H03M 13/6513 (2013.01); H03M 13/2963 (2013.01);
Abstract
The present invention includes generating a tie-breaking metric via a comparative tie-breaking metric training process, monitoring an output of a channel detector in order to identify a tie condition between a first log-likelihood ratio (LLR) value and a second LLR value of a symbol, and upon identifying a tie condition between the first LLR value and the second LLR value of the symbol, applying the generated tie-breaking metric to the symbol in order to assign a hard decision to the symbol.