The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

Jun. 06, 2013
Applicant:

Wistron Corporation, New Taipei, TW;

Inventors:

Ding-Shiuan Ho, New Taipei, TW;

Fu-Nen Lo, New Taipei, TW;

Assignee:

Wistron Corporation, New Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/08 (2006.01); G11C 29/56 (2006.01); G11C 5/04 (2006.01);
U.S. Cl.
CPC ...
G11C 29/08 (2013.01); G11C 5/04 (2013.01); G11C 29/56016 (2013.01);
Abstract

A memory test device used to test performance of at least one memory module on an electronic device, are provided. The memory test device includes at least one adapter and a control unit. The adapter includes a plugging portion, a slot, and a switch circuit. The plugging portion is used to be plugged in a memory module slot of the electronic device. The slot is connected electrically to the plugging portion, is used for the memory module to plug in, and is capable of outputting a work voltage to the memory module when the adapter is plugged in the memory module slot and connected electrically to it. The switch circuit is connected electrically to the plugging portion and the slot. The control unit is connected electrically to the switch circuit of each adapter, where the control unit enables or disables the plugged memory module by controlling the switch circuit.


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