The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Feb. 29, 2012
James L. Hood, Seattle, WA (US);
James L. Hood, Seattle, WA (US);
Amazon Technologies, Inc., Reno, NV (US);
Abstract
Systems and methods involve prioritizing information based at least in part on test results for tests. A computing device may administer one or more tests and/or may receive test results for one or more tests. Multiple executions of one or more tests may be administered over a period of time. A device administering a test may evaluate the functionality of at least a portion of an application programming interface (API) or at least a portion of a user interface. Test results may be analyzed to determine a failure pattern and/or pass rate for one or more tests. Test results may be analyzed to determine an error signature and/or error signature frequency for one or more test results. A report can be generated that prioritizes information based at least in part on the tests, test results, and/or any determined information.