The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Aug. 09, 2011
Integrated testing system utilizing a test script and a test environment created based on the script
Daniel Mccoy, St. Augustine, FL (US);
Lynne Sommer, Jacksonville, FL (US);
John Mckenzie, Jacksonville, FL (US);
Daniel McCoy, St. Augustine, FL (US);
Lynne Sommer, Jacksonville, FL (US);
John McKenzie, Jacksonville, FL (US);
Bank of America Corporation, Charlotte, NC (US);
Abstract
Systems, methods, apparatuses, and computer readable media for testing information technology systems and/or applications are provided. In some examples, data may be categorized as frequently used and stored at an information technology system testing system. One or more portions of the frequently used data may then be identified for use in testing an information technology system. The systems, methods, and the like may further include building a testing environment and receiving a test script. In some examples, one or more data types may be identified for use in testing the information technology system based on various project criteria, the received test script, and the like. In some examples, additional data types and data associated therewith may be identified as associated with the one or more identified data types based on a predefined relationship. This additional data may then be automatically included in the testing of the information technology system.