The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

Nov. 16, 2012
Applicant:

Microsoft Corporation, Redmond, WA (US);

Inventors:

Karin Strauss, Seattle, WA (US);

Burton J. Smith, Seattle, WA (US);

Kathryn S. McKinley, Bellevue, WA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 12/02 (2006.01); G11C 29/00 (2006.01); G11C 13/00 (2006.01); G11C 29/04 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0246 (2013.01); G11C 13/004 (2013.01); G11C 29/808 (2013.01); G11C 29/82 (2013.01); G11C 2029/0409 (2013.01);
Abstract

The techniques discussed herein identify failed segments of memory in a memory region. The techniques may then manage the failed segments of memory by logically clustering the failed segments of memory at an outlying portion of the memory region using a remapping process. The remapping process may include creating and storing remapping metadata defining segment remapping entries for the memory region. Accordingly, the failure clustering logically eliminates or reduces the memory fragmentation so that a system can allocate larger portions of contiguous memory for object storage.


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