The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

Jan. 09, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

John P. Agombar, Winchester, GB;

Matthew J. Fairhurst, Winchester, GB;

John E. Lindley, San Jose, CA (US);

Lee J. Sanders, Winchester, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G06F 3/06 (2006.01); G06F 11/10 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0689 (2013.01); G06F 11/1076 (2013.01); G06F 3/061 (2013.01); G06F 3/0665 (2013.01);
Abstract

Aspects of the present invention relate to an apparatus and corresponding method that includes reading data from a first portion of an in-use redundant array of independent disks (RAID), wherein the first portion of the in-use RAID is arranged according to a first array configuration having at least a first parameter. One or more reserved extents in a storage pool is used to store at least a first portion of the data for writing to the in-use RAID. One or more free extents in the storage pool and/or in the in-use RAID is used to store at least a second portion of the data for writing to the in-use RAID. The data is written to a second portion of the in-use RAID. The second portion of the in-use RAID is arranged according to a second array configuration having at least a second parameter.


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