The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

Feb. 14, 2013
Applicant:

Palantir Technologies, Inc., Palo Alto, CA (US);

Inventors:

Jordan Potter, San Francisco, CA (US);

Nir Ackner, Palo Alto, CA (US);

David Cohen, Palo Alto, CA (US);

Assignee:

Palantir Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30398 (2013.01); G06F 17/30277 (2013.01);
Abstract

A method and apparatus for a data analysis system for analyzing data object collections is provided. The data analysis system includes one or more graphical user interfaces comprising various interface elements that enable users to create visual queries. A visual query is constructed as a graph representing a pattern of interest in a collection of data objects. A visual query may include one or more graph elements and property information associated with the specified graph elements. After a user has constructed a visual query, the system may transform the visual query into a query template. A query engine may then execute the query template to search a data object collection for data object results corresponding to the specified pattern. The search for instances of a specified pattern in a collection of data objects is referred herein to as a 'search around.'


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