The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Mar. 04, 2011
George Morgan Mathews, Bristol, GB;
David Nicholson, Bristol, GB;
Mark Lawrence Williams, Bristol, GB;
Andrew Peter Henry Mccabe, Wotton-under-Edge, GB;
George Morgan Mathews, Bristol, GB;
David Nicholson, Bristol, GB;
Mark Lawrence Williams, Bristol, GB;
Andrew Peter Henry McCabe, Wotton-under-Edge, GB;
BAE SYSTEMS plc, , GB;
Abstract
An apparatus and method are disclosed for analysing a process. An exemplary method includes: generating a process template; and determining a probabilistic model specifying the process template. The method can include use of task nodes for tasks of the process; observables nodes for observables that may be caused by performance of the tasks; and a background activities node, wherein observables may further be caused by background activities of the background node. The method can include use of task nodes for tasks of the process; observables nodes for observables that may be caused by performance of the tasks; and a background activities node, observables may further be caused by background activities of the background node. The method can include measuring values of an observable corresponding to one of the observables nodes; and updating a probabilistic estimate of the process state using the measured values.