The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
May. 15, 2003
Christopher Flask, Avon Lake, OH (US);
Jonathan Lewin, Beachwood, OH (US);
Daniel Elgort, Cleveland Heights, OH (US);
Ken Pin Wang, Houston, TX (US);
Eddy Wong, Cleveland Heights, OH (US);
Jeffrey Duerk, Avon Lake, OH (US);
Christopher Flask, Avon Lake, OH (US);
Jonathan Lewin, Beachwood, OH (US);
Daniel Elgort, Cleveland Heights, OH (US);
Ken Pin Wang, Houston, TX (US);
Eddy Wong, Cleveland Heights, OH (US);
Jeffrey Duerk, Avon Lake, OH (US);
Other;
Abstract
A new and improved method for tracking and/or spatial localization of an invasive device in Magnetic Resonance Imaging (MRI) is provided. The invention includes providing an invasive device including a marker having a chemically shifted signal source with a resonant frequency different from the chemical species of the subject to be imaged, applying a pulse sequence, detecting the resulting RF magnetic resonance signals, and determining the 3D coordinates of the marker. The invention also includes generating scan planes and reconstructing an image from the detected signals to generate an image having the marker contrasted from the subject. The invasive device includes a marker having a chemically shifted signal source which has a resonant frequency different from the chemical species of the subject to be imaged for use in tracking the device during imaging.