The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Dec. 02, 2009
Juergen Erwin Rahmer, Hamburg, DE;
Jeurgen Weizenecker, Stutensee, DE;
Bernhard Gleich, Hamburg, DE;
Juergen Erwin Rahmer, Hamburg, DE;
Jeurgen Weizenecker, Stutensee, DE;
Bernhard Gleich, Hamburg, DE;
Koninklijke Philips N.V., Eindhoven, NL;
Abstract
In Magnetic Particle Imaging (MPI) the reconstruction requires the knowledge of a so called system function. This function describes the relation between spatial position and frequency response and is currently measured once for a scanner set-up and a tracer material. For reasonable resolutions and fields of view the system function becomes quite large, resulting in large acquisition times to obtain reasonable signal-to-noise. However, the system function has a number of properties which can be used to improve signal-to-noise. According to the present invention use is made of the spatial symmetry and/or identical responses at different frequencies for this purpose.