The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Jul. 03, 2013
Applicant:
Electronics and Telecommunications Research Institute, Daejeon, KR;
Inventors:
Joong-Seon Choe, Daejeon, KR;
Chun Ju Youn, Daejeon, KR;
Jong-Hoi Kim, Daejeon, KR;
Duk Jun Kim, Daejeon, KR;
Yong-Hwan Kwon, Daejeon, KR;
Kwang-Seong Choi, Daejeon, KR;
Eun Soo Nam, Daejeon, KR;
Assignee:
Electronics and Telecommunications Research Institute, Daejeon, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/06 (2006.01); H04B 10/077 (2013.01);
U.S. Cl.
CPC ...
H04B 10/0779 (2013.01);
Abstract
Provided is a method of measuring signal transmission time difference of a measuring device. The measuring device according to embodiments, by measuring a skew on two optical paths through signal delays of sufficient sizes for skew measurement on the optical paths, even a skew having a minute size can be measured within a measurable range.