The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
May. 23, 2014
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventor:
Fan Zhai, Richardson, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 5/20 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/20 (2013.01); G06T 5/007 (2013.01); G06T 5/003 (2013.01); G06T 5/008 (2013.01); G06T 2207/20032 (2013.01); G06T 2207/20192 (2013.01);
Abstract
A content-adaptive edge and detail enhancement apparatus is described for image/video processing. Both 2D peaking and LTI/CTI are used in sharpening pictures. Image analysis is performed to generate a blending factor to control the use of the two peaking techniques. The strength or likelihood of edges or transitions is measured and such a strength or likelihood measurement will be transformed into the blending factor controlling the blending of the LTI/CTI and peaking outputs.