The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Oct. 28, 2011
Evan J. Ribnick, St. Louis Park, MN (US);
Kenneth G. Brittain, Cottage Grove, MN (US);
John A. Ramthun, Hudson, WI (US);
Derek H. Justice, Cary, NC (US);
Guillermo Sapiro, Durham, NC (US);
Evan J. Ribnick, St. Louis Park, MN (US);
Kenneth G. Brittain, Cottage Grove, MN (US);
John A. Ramthun, Hudson, WI (US);
Derek H. Justice, Cary, NC (US);
Guillermo Sapiro, Durham, NC (US);
3M Innovative Properties Company, St. Paul, MN (US);
Abstract
A computerized inspection system is described for detecting the presence of non-uniformity defects and providing output indicative of a severity of each type of non-uniformity defect. Techniques are described that increase the throughput of the inspection system. Algorithmic and hardware approaches are described to significantly decrease the average amount of time required to inspect a given quantity of material that is expected to be mostly uniform. The techniques described herein involve dynamic selection of which image features to compute by starting with a base feature set and only triggering additional feature computations as needed until the features are sufficient to compute a severity for each type of non-uniformity defect. The number of features extracted and the order in which the features are extracted is dynamically determined in real-time to reduce a cost associated with the feature extraction.