The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

Oct. 26, 2011
Applicant:

Gilad Shechter, Haifa, IL;

Inventor:

Gilad Shechter, Haifa, IL;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); A61B 6/03 (2006.01); A61B 6/00 (2006.01); G01N 23/04 (2006.01); G06T 11/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); A61B 6/032 (2013.01); A61B 6/4035 (2013.01); A61B 6/482 (2013.01); A61B 6/5205 (2013.01); A61B 6/5258 (2013.01); G01N 23/046 (2013.01); G06T 11/005 (2013.01); G06T 2211/408 (2013.01); G01N 2223/419 (2013.01);
Abstract

A method includes extracting a fully sampled fixed kVp sinogram for a pre-determined kVp of interest from an under-sampled mixed kVp sinogram generated from a switched kVp computed tomography scan. A system includes a fixed sinogram extractor that extracts a fully sampled fixed kVp sinogram from an under-sampled mixed kVp sinogram from a switched kVp computed tomography scan. A method includes de-noising at least one of a fully sampled fixed kVp sinogram extracted from an under-sampled mixed kVp sinogram or the under-sampled mixed kVp sinogram by smoothing lower kVp measurements of the sinograms and sharpening higher kVp measurements of the sinograms.


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