The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

Feb. 01, 2013
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Toshiba Medical Systems Corporation, Otawara-Shi, Tochigi-Ken, JP;

Inventor:

Daxin Shi, Vernon Hills, IL (US);

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 11/00 (2006.01); G21K 3/00 (2006.01);
U.S. Cl.
CPC ...
G06T 11/003 (2013.01);
Abstract

Noise map for CT images have been estimated by generalizing the prior art even-and-odd views approach. One example is to estimate a noise map from images reconstructed from three sets of independent views. A second example is to estimate a noise map from images reconstructed by using two sets of correlated views. A third example is to estimate a noise map from noise map from two images reconstructed from two sets of independent views while the number of views in each set is unequal. Physical phantom data were employed to validate our proposed noise map estimation methods. In comparison to the existing method, our alternative methods yield reasonably accurate noise map estimation.


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