The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Jan. 27, 2011
Taihei Mukaide, Yokohama, JP;
Takashi Noma, Hadano, JP;
Kazunori Fukuda, Fujisawa, JP;
Masatoshi Watanabe, Isehara, JP;
Kazuhiro Takada, Kawasaki, JP;
Taihei Mukaide, Yokohama, JP;
Takashi Noma, Hadano, JP;
Kazunori Fukuda, Fujisawa, JP;
Masatoshi Watanabe, Isehara, JP;
Kazuhiro Takada, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An X-ray imaging apparatus acquiring a differential phase contrast image of a test object without using a light-shielding mask for X-ray. The apparatus includes an X-ray source, a splitting element configured to spatially divide an X-ray emitted from an X-ray source and a scintillator configured to emit light when a divided X-ray beam divided at the splitting element is incident on the scintillator. The apparatus also includes a light-transmission limiting unit configured to limit transmitting amount of the light emitted from the scintillator and a plurality of light detectors each configured to detect the amount of light that has transmitted through the light-transmission limiting unit. The light-transmission limiting unit is configured such that a light intensity detected at each of the light detectors changes in response to a change in an incident position of the X-ray beam.