The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Sep. 05, 2012
Applicants:
Brian S Bourgeois, Slidell, LA (US);
Lewis F. Jones, Iii, Hattiesburg, MS (US);
Inventors:
Brian S Bourgeois, Slidell, LA (US);
Lewis F. Jones, III, Hattiesburg, MS (US);
Assignee:
The United States of America, as represented by the Secretary of the Navy, Washington, DC (US);
Primary Examiner:
Int. Cl.
CPC ...
G01S 15/89 (2006.01); G01S 7/53 (2006.01);
U.S. Cl.
CPC ...
G01S 15/89 (2013.01); G01S 7/53 (2013.01);
Abstract
System and method for rapidly determining the geographic areas where spatial overlap of arbitrarily oriented (i.e. not just parallel) swath sensor data meets a pre-selected specified percentage of swath width.
Bourgeois, Brian. (2015). System and method for swath overlap detection (U.S. Patent No. 9030915). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9030915
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile