The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

May. 09, 2014
Applicant:

Optometrics Corporation, Littleton, MA (US);

Inventors:

David E. Ventola, Avon, MA (US);

Zbynek Ryzi, Littleton, MA (US);

Assignee:

Optometrics Corporation, Littleton, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 5/18 (2006.01); G02B 5/20 (2006.01);
U.S. Cl.
CPC ...
G02B 5/1814 (2013.01); G02B 5/203 (2013.01); Y10T 29/49826 (2015.01);
Abstract

Optical components and systems comprising combined optical filters and diffraction gratings are generally described. In certain embodiments, an optical filter is in contact with a diffraction grating. In certain embodiments, the optical filter and the diffraction grating can be used to diffract and direct a first portion of electromagnetic radiation incident upon the grating and filter toward a receiver while filtering a second portion of the electromagnetic radiation incident upon the grating and filter.


Find Patent Forward Citations

Ventola, David. (2015). Combination optical filter and diffraction grating and associated systems and methods (U.S. Patent No. 9030742). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9030742

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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