The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Dec. 22, 2011
Kyungwook Park, ChungCheongNam-Do, KR;
Yoonyoung Kwon, ChungCheongNam-Do, KR;
Jaeyoung Choi, ChungCheongNam-Do, KR;
Jongsung Lee, ChungCheongNam-Do, KR;
Hoikwan Lee, ChungCheongNam-Do, KR;
Seo-yeong Cho, ChungCheongNam-Do, KR;
Kyungmin Yoon, ChungCheongNam-Do, KR;
Kyungwook Park, ChungCheongNam-Do, KR;
YoonYoung Kwon, ChungCheongNam-Do, KR;
Jaeyoung Choi, ChungCheongNam-Do, KR;
Jongsung Lee, ChungCheongNam-Do, KR;
Hoikwan Lee, ChungCheongNam-Do, KR;
Seo-Yeong Cho, ChungCheongNam-Do, KR;
Kyungmin Yoon, ChungCheongNam-Do, KR;
Abstract
An apparatus for measuring transmissivity of a patterned glass substrate. A beam radiator radiates a laser beam. A collimation lens collimates the laser beam radiated from the laser beam radiator. A beam expander expands a size of the laser beam collimated by the collimation lens. A detector has a light-receiving section, which receives the laser beam that has passed through the patterned glass substrate after having been expanded by the beam expander. A measuring instrument measures a transmissivity of the patterned glass substrate using the laser beam received by the detector.