The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

Apr. 19, 2012
Applicants:

Vikrant R. Bhakta, Dallas, TX (US);

Manjunath Somayaji, Arlington, TX (US);

Marc P. Christensen, McKinney, TX (US);

Inventors:

Vikrant R. Bhakta, Dallas, TX (US);

Manjunath Somayaji, Arlington, TX (US);

Marc P. Christensen, McKinney, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01); H04N 5/232 (2006.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23212 (2013.01); G06T 5/003 (2013.01);
Abstract

Systems and methods can be configured to perform operations related to digital image processing. In a general aspect, this disclosure describes systems and methods relating to processing digital images for imaging system characterization and image quality enhancement. In some implementations, a method for digital image processing includes measuring a first phase transfer function (PTF) of a first digital image and a second PTF of a second digital image. The second digital image captures a spatially shifted version of the first digital image. The first PTF and the second PTF are compared and a spatial shift of the second image to the first image is determined.


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