The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

Sep. 29, 2009
Applicants:

Michel Pichon, Gouvieux, FR;

Franc Davenne, Thourotte, FR;

Inventors:

Michel Pichon, Gouvieux, FR;

Franc Davenne, Thourotte, FR;

Assignee:

Saint-Gobain Glass France, Courbevoie, FR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G01B 11/25 (2006.01); G01N 21/896 (2006.01); G01N 21/958 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2513 (2013.01); G01N 21/896 (2013.01); G01N 21/958 (2013.01); G01N 2021/9586 (2013.01);
Abstract

An analysis device for analysing a transparent or specular surface of a substrate, the device including a raster located opposite the surface of the substrate to be measured, a video camera for capturing at least one image of the raster deformed by the measured substrate, a raster lighting system, and an image-processing and digital analysis mechanism connected to the video camera. The video camera is a matrix array camera, the raster is provided on a substrate having an oblong shape and is bidirectional including a first pattern extending along a first direction and along a smallest extension of the substrate, the first pattern being transversely periodical to the smallest extension, and a second pattern extending in a second direction perpendicular to the first pattern and along a largest extension of the substrate.


Find Patent Forward Citations

Loading…