The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Dec. 13, 2010
Alain Simon, Les Mesnuls, FR;
Alain Simon, Les Mesnuls, FR;
Thales, Courbevoie, FR;
Abstract
A method for calibrating measurement instruments of an optronic system in motion, with positions P, P, . . . , P, . . . , comprises: a device for acquiring images of a scene comprising a fixed object G; and means for tracking the fixed object Gduring the acquisition of these images; means for obtaining the positions P, P, . . . ; at least one instrument for measuring the distance and/or an instrument for measuring angles of orientation and/or of attitude between this measurement instrument and the fixed object G, according to a line of sight LoS. It comprises the following steps: acquisition at instants t, t, . . . of at least two images, each image being acquired on the basis of different positions P, P, . . . of the system, the fixed object Gbeing sighted in each image, but its position being unknown; acquisition at the instants t', t′, . . . of measurements of distance and/or of angle; synchronization of the measurements of distance and/or of angle with the positions P, P, . . . established at instants t, t, . . . ; estimation of the measurement defects which minimize the dispersion of at least two points of intersection Gbetween the LoS at the position Pand the LoS at the position P, as a function of said measurements and of the known positions P, Pof the system.