The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Dec. 02, 2011
Applicant:
Takaaki Okamoto, Fujisawa, JP;
Inventor:
Takaaki Okamoto, Fujisawa, JP;
Assignee:
Nikon Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/18 (2006.01); G02B 21/36 (2006.01); G02B 21/00 (2006.01); G06T 7/00 (2006.01); G06T 5/50 (2006.01); G02B 15/04 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 15/04 (2013.01); G02B 21/0088 (2013.01); G06T 7/0028 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10064 (2013.01); G06T 2207/30024 (2013.01); G06T 5/50 (2013.01);
Abstract
An image processor, a program and a microscope enable a TIRF image and a confocal image to be superposed simply and accurately. A reference point detection unitdetects, reference points, three or more images respectively from a TIRF image of a predetermined surface of a sample obtained using a total internal reflection fluorescence microscope, and a confocal image of the predetermined surface of the sample obtained using a confocal microscope. A superposing unit superposes the TIRF image and the confocal image using a coordinate transformation coefficient.