The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

Jun. 05, 2013
Applicant:

Tom Marttila, Espoo, FI;

Inventor:

Tom Marttila, Espoo, FI;

Assignee:

Tecnomar Oy, , FI;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 2/47 (2006.01); B41J 2/045 (2006.01); B23K 26/03 (2006.01); B23K 26/08 (2014.01); B41J 11/46 (2006.01); G01D 15/14 (2006.01);
U.S. Cl.
CPC ...
B41J 2/04505 (2013.01); B23K 26/032 (2013.01); B23K 26/0846 (2013.01); B41J 11/46 (2013.01);
Abstract

A laser process alignment measuring method applicable to a reel-to-reel manufacturing process including a laser process stage, wherein before at least one laser process stage, marks, patterns or surfaces () are made with printing ink on the base or carrier material of the web (), and on which the laser beam used can make a mark (), for example, by removing or changing the printing ink, whereby at the laser process stage, another mark is plotted with the laser beam on the mark et al. printed with printing ink, and the position of the mark et al. printed with printing ink () and the mark plotted with the laser () are read optically to measure the alignment of the printing ink stage and the laser process stage.


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