The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

Oct. 05, 2010
Applicants:

Kazutake Uehira, Tokyo, JP;

Masahiro Suzuki, Saitama, JP;

Inventors:

Kazutake Uehira, Tokyo, JP;

Masahiro Suzuki, Saitama, JP;

Assignee:

Empire Technology Development LLC, Wilmington, DE (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 15/00 (2011.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2513 (2013.01); G01B 11/2545 (2013.01);
Abstract

Technologies are generally described for generating depth data based on a spatial light pattern. In some examples, a method of generating depth data includes obtaining an image of one or more objects on which a spatial light pattern is projected, wherein blurring of the spatial light pattern in the image monotonously increases or decreases in a depth direction, calculating a value of a spatial frequency component of the image in a local image area around a pixel of interest, and determining depth data corresponding to the calculated value of the spatial frequency component by utilizing a preset relationship between depths and values of the spatial frequency component.


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