The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Aug. 08, 2011
Aleksandar Uzelac, Seattle, WA (US);
David A. Stevens, Sammamish, WA (US);
Weidong Zhao, Redmond, WA (US);
Takahiro Shigemitsu, Bellevue, WA (US);
Briggs A. Willoughby, Newcastle, WA (US);
John Graham Pierce, Sammamish, WA (US);
Pravin Kumar Santiago, Issaquah, WA (US);
Craig S. Ranta, Redmond, WA (US);
Timothy Allen Wright, Redmond, WA (US);
Jeffrey C. Maier, Kirkland, WA (US);
Robert T. Perry, Seatac, WA (US);
Stanimir Naskov Kirilov, Kirkland, WA (US);
Andrey B. Batchvarov, Redmond, WA (US);
Aleksandar Uzelac, Seattle, WA (US);
David A. Stevens, Sammamish, WA (US);
Weidong Zhao, Redmond, WA (US);
Takahiro Shigemitsu, Bellevue, WA (US);
Briggs A. Willoughby, Newcastle, WA (US);
John Graham Pierce, Sammamish, WA (US);
Pravin Kumar Santiago, Issaquah, WA (US);
Craig S. Ranta, Redmond, WA (US);
Timothy Allen Wright, Redmond, WA (US);
Jeffrey C. Maier, Kirkland, WA (US);
Robert T. Perry, Seatac, WA (US);
Stanimir Naskov Kirilov, Kirkland, WA (US);
Andrey B. Batchvarov, Redmond, WA (US);
Microsoft Technology Licensing, LLC, Redmond, WA (US);
Abstract
Touchscreen testing techniques are described. In one or more implementations, a piece of conductor (e.g., metal) is positioned as proximal to a touchscreen device and the touchscreen device is tested by simulating a touch of a user. This technique may be utilized to perform a variety of different testing of a touchscreen device, such as to test latency and probabilistic latency. Additional techniques are also described including contact geometry testing techniques.