The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Jul. 19, 2012
Loke Tan, Newport Coast, CA (US);
Steven Jaffe, Irvine, CA (US);
Hong Liu, Irvine, CA (US);
Lin He, Irvine, CA (US);
Randall Perlow, San Clemente, CA (US);
Peter Cangiane, Hermosa Beach, CA (US);
Ramon Gomez, San Juan Capistrano, CA (US);
Giuseppe Cusmai, Mission Viejo, CA (US);
Loke Tan, Newport Coast, CA (US);
Steven Jaffe, Irvine, CA (US);
Hong Liu, Irvine, CA (US);
Lin He, Irvine, CA (US);
Randall Perlow, San Clemente, CA (US);
Peter Cangiane, Hermosa Beach, CA (US);
Ramon Gomez, San Juan Capistrano, CA (US);
Giuseppe Cusmai, Mission Viejo, CA (US);
Broadcom Corporation, Irvine, CA (US);
Abstract
Various multi-lane ADCs are disclosed that substantially compensate for impairments present within various signals that result from various impairments, such as phase offset, amplitude offset, and/or DC offset to provide some examples, such that their respective digital output samples accurately represent their respective analog inputs. Generally, the various multi-lane ADCs determine various statistical relationships, such as various correlations to provide an example, between these various signals and various known calibration signals to quantify the phase offset, amplitude offset, and/or DC offset that may be present within the various signals. The various multi-lane ADCs adjust the various signals to substantially compensate for the phase offset, amplitude offset, and/or DC offset based upon these various statistical relationships such that their respective digital output samples accurately represent their respective analog inputs.