The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2015

Filed:

Dec. 19, 2011
Applicants:

Dmitri Simonian, Sunnyvale, CA (US);

Mikhail Fouksman, Emerald Hills, CA (US);

Inventors:

Dmitri Simonian, Sunnyvale, CA (US);

Mikhail Fouksman, Emerald Hills, CA (US);

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/25 (2006.01); G01N 21/64 (2006.01); G01N 21/27 (2006.01); G01N 21/59 (2006.01); G01N 21/47 (2006.01);
U.S. Cl.
CPC ...
G01N 21/64 (2013.01); G01N 21/274 (2013.01); G01N 21/59 (2013.01); G01N 2021/4742 (2013.01); G01N 2201/065 (2013.01);
Abstract

A structure for testing a luminescent film includes a Lambertian light source, an integrating sphere having an input port, and a measuring device. The Lambertian light source includes a mixing chamber having an input port and an output port, and a light emitter coupled to the input port. During testing the luminescent film is positioned between the output port of the mixing chamber and the input port of the integrating sphere. The measuring device is optically coupled to the integrating sphere.


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