The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 2015
Filed:
Apr. 12, 2007
Brent E. Modzelewski, Boca Raton, FL (US);
Ferhan Kayihan, Tacoma, WA (US);
Edward Cardello, Wellington, FL (US);
Brent E. Modzelewski, Boca Raton, FL (US);
Ferhan Kayihan, Tacoma, WA (US);
Edward Cardello, Wellington, FL (US);
Nipro Diagnostics, Inc., Fort Lauderdale, FL (US);
Abstract
A system for measuring a property of a sample is provided. The system comprises a diagnostic measuring device having a memory and a diagnostic test strip for collecting the sample. The strip has embedded thereon a pattern representative of at least first data and second data, the first data being data representing at least one of parameters related to measuring the property, codes usable for calibration of the diagnostic measuring device, or parameters indicating proper connection between the measuring device and the test strip and the second data usable for detecting and rejecting potential errors affecting the proper measurement of the property.