The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2015

Filed:

Jun. 28, 2011
Applicants:

Ritsuko Kano, Tokyo, JP;

Yoshihito Ohki, Tokyo, JP;

Akihiro Komori, Tokyo, JP;

Reiko Miyazaki, Tokyo, JP;

Inventors:

Ritsuko Kano, Tokyo, JP;

Yoshihito Ohki, Tokyo, JP;

Akihiro Komori, Tokyo, JP;

Reiko Miyazaki, Tokyo, JP;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/048 (2013.01); G06F 3/0488 (2013.01); G06F 3/0484 (2013.01);
U.S. Cl.
CPC ...
G06F 3/04883 (2013.01); G06F 3/04847 (2013.01);
Abstract

There is provided an information processing apparatus including a position detection unit for detecting a contact position of an operating tool which has contacted a screen, an area size detection unit for detecting a contact area size of the operating tool which has contacted the screen, a pressure detection unit for detecting a pressure of the operating tool pressing the screen, and a parameter setting unit for setting, according to the contact area size of the operating tool on an object for parameter setting displayed on the screen and the pressure of the operating tool pressing the object, a size of a parameter associated with the object.


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