The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2015
Filed:
Jul. 25, 2013
Nec Laboratories America, Inc., Princeton, NJ (US);
Abhishek Sharma, New Brunswick, NJ (US);
Haifeng Chen, Old Bridge, NJ (US);
Min Ding, Chalfont, PA (US);
Kenji Yoshihira, Princeton Junction, NJ (US);
Guofei Jiang, Princeton, NJ (US);
NEC Laboratories America, Inc., Princeton, NJ (US);
Abstract
A computer implemented method for temporal ranking in invariant networks includes considering an invariant network and a set of broken invariants in the invariant network, assuming, for each time point inside a window W, that each metric with broken invariants is affected by a fault at that time point, computing an expected pattern for each invariant of a metric with assumed fault, said pattern indicative of time points at which an invariant will be broken given that its associated metric was affected by a fault at time t, comparing the expected pattern with the pattern observed over the time window W; and determining a temporal score based on a match from the prior comparing.