The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2015

Filed:

Jun. 25, 2013
Applicants:

Volker Driesen, Walldorf, DE;

Christoph Luettge, Muehltal, DE;

Andreas Jahr, Karlsruhe, DE;

Inventors:

Volker Driesen, Walldorf, DE;

Christoph Luettge, Muehltal, DE;

Andreas Jahr, Karlsruhe, DE;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/303 (2013.01);
Abstract

Example systems and methods of database migration optimized by feedback are presented. In one example, a migration of database data from a first to a second database by multiple concurrent processes may be initiated on a computing system. Processing time of at least some of the processes may be monitored during the migration. Based on this monitoring, at least one portion of the database data being migrated by one of the concurrent processes may be segmented into multiple segments, wherein each of the multiple segments may be migrated by a separate one of the concurrent processes. Also, a load on the computing system may be monitored during the migration. Based on this monitoring, a number of the concurrent processes may be adjusted. In other examples, consistency checking for subsequent database migrations may be based on consistency checking results for the current migration.


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