The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2015
Filed:
Mar. 02, 2012
Renbin Peng, San Jose, CA (US);
Pramod K. Varshney, Fayetteville, NY (US);
Renbin Peng, San Jose, CA (US);
Pramod K. Varshney, Fayetteville, NY (US);
Syracuse University, Syracuse, NY (US);
Abstract
Apparatus and method for improving the performance of a threshold-based detector or classifier, or a generic detector or classifier and increasing the probability of detecting at least one object in an image using novel algorithms and stochastic resonance noise is provided, where a suitable dose of noise is introduced to the image data such that the performance of the above-referenced detectors or classifiers is improved without altering the detector's or classifier's parameters. Several stochastic resonance (SR) noise-based detection and classification enhancement schemes are presented. The SR noise-enhanced detection and classification schemes can improve any algorithms and systems. To implement these schemes, the only knowledge that is needed is the original input data (no matter 1D, 2D, 3D or others) and the output (detection results) of the existing algorithms and systems.