The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2015

Filed:

Aug. 31, 2012
Applicants:

Eung Sun Kim, Suwon-si, KR;

Dohyung Park, Seoul, KR;

Yong Kim, Seoul, KP;

Inventors:

Eung Sun Kim, Suwon-si, KR;

Dohyung Park, Seoul, KR;

Yong Kim, Seoul, KP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/20 (2006.01); H04W 4/02 (2009.01);
U.S. Cl.
CPC ...
G01C 21/20 (2013.01); H04W 4/021 (2013.01);
Abstract

A method of calculating an accuracy of measuring a location, and a method and apparatus to measure a location of a terminal using the accuracy of measuring the location, are provided. The method of calculating the accuracy of measuring the location of the terminal includes providing a map corresponding to a location measurement type that is used in the terminal. The method further includes reading, from the map, map information of a predetermined area including the location of the terminal. The method further includes calculating the accuracy of measuring the location with the location measurement type based on the map information.


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