The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2015
Filed:
Feb. 09, 2009
Applicants:
Robin Taylor, Berkshire, GB;
Richard Holley, Berkshire, GB;
Austen Hearn, Reading, GB;
Inventors:
Assignee:
Lein Applied Diagnostics, Workingham, Berkshire, GB;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 5/1455 (2006.01); A61B 3/10 (2006.01); A61B 5/145 (2006.01);
U.S. Cl.
CPC ...
A61B 5/1455 (2013.01); A61B 3/1005 (2013.01); A61B 5/14532 (2013.01);
Abstract
A measurement apparatus comprises a probe system () operably coupled, when in use, to a processing resource (). The probe system () and the processing resource () are arranged, when in use, to measure an apparent thickness change of a volume of the medium () to be measured and to determine a physiological parameter using the measurement of the apparent thickness change.