The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2015

Filed:

Jun. 29, 2012
Applicants:

Jihwan P. Choi, San Jose, CA (US);

Jiwon S. Han, San Ramon, CA (US);

Hui-ling Lou, Sunnyvale, CA (US);

Inventors:

Jihwan P. Choi, San Jose, CA (US);

Jiwon S. Han, San Ramon, CA (US);

Hui-Ling Lou, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 28/08 (2009.01); H04W 84/18 (2009.01); H04W 4/12 (2009.01);
U.S. Cl.
CPC ...
H04W 4/12 (2013.01);
Abstract

Systems, methods, and other embodiments associated with scheduling of measurement gaps and on-duration intervals for a wireless station are described. According to one embodiment, a controller for controlling a station that wirelessly communicates with a base station is disclosed. The station is within a wireless range of the base station and one or more neighboring stations. The controller includes a scheduling logic configured to control the station, while the station is in an idle mode, to receive control information from the base station by scheduling a period of time for an on-duration interval. The scheduling logic is configured to control the station to listen to the one or more neighboring stations by scheduling a period of time for a measurement gap. The measurement gap is scheduled to avoid overlapping with the on-duration interval.


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