The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2015
Filed:
Jan. 10, 2012
Hiroaki Morikawa, Kawasaki, JP;
Tatsuya Asai, Kawasaki, JP;
Hiroya Inakoshi, Kawasaki, JP;
Shinichiro Tago, Kawasaki, JP;
Nobuhiro Yugami, Kawasaki, JP;
Seishi Okamoto, Kawasaki, JP;
Hiroaki Morikawa, Kawasaki, JP;
Tatsuya Asai, Kawasaki, JP;
Hiroya Inakoshi, Kawasaki, JP;
Shinichiro Tago, Kawasaki, JP;
Nobuhiro Yugami, Kawasaki, JP;
Seishi Okamoto, Kawasaki, JP;
Fujitsu Limited, Kawasaki, JP;
Abstract
An apparatus extracts an area having a highest score or a lowest score that is calculated based on evaluation values of points from a target area including a set of a plurality of points that can be distributed at two-dimensional coordinates. It determines whether the area extracted and an area overlapping a plurality of the target areas intersect with each other, and deletes an area having a lower score or a higher score out of the areas determined to intersect with each other. It selects an area having a highest score or a lowest score out of the areas extracted at the extracting and not deleted at the determining. One or a plurality of areas are generated as the target areas based on an area acquired by excluding the area selected from the target area and an area acquired by excluding the area deleted at the determining.