The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2015

Filed:

Oct. 23, 2012
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Sung Su Park, Seoul, KR;

Tae Gil Eum, Suwon-si, KR;

Eun Seok Im, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04R 29/00 (2006.01); G10L 25/69 (2013.01);
U.S. Cl.
CPC ...
G10L 25/69 (2013.01);
Abstract

An apparatus for evaluating sound quality and a method thereof may include generating an original sound, measuring a test sound generated from a subject of sound quality evaluation, analyzing a signal of the test sound measured according to a time domain, generating a plurality delay signals that are delayed from the signal of the time domain by one period, determining a degree of matching by matching the signal of the time domain to each delay signal, determining whether a white nose is occurred based on the degree of matching, and outputting the status of the white noise on the subject of the sound evaluation. The signal of the test sound may be analyzed according to a frequency domain, and a degree of occurrence of buzz and rattle is determined based on a fundamental frequency of the frequency domain and a plurality of Harmonics corresponding to the frequency domain.


Find Patent Forward Citations

Loading…