The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2015

Filed:

Sep. 27, 2012
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventor:

Hiroyasu Ishii, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); G01N 23/20 (2006.01);
U.S. Cl.
CPC ...
A61B 6/484 (2013.01); G01N 23/20075 (2013.01); G21K 2207/005 (2013.01); G01N 2223/304 (2013.01); G01N 2223/401 (2013.01); A61B 6/4291 (2013.01);
Abstract

A radiation imaging apparatus includes a differential phase image producing section, a phase unwrapping section, a statistical operation section, and a correction processing section. The differential phase image producing section produces a differential phase image in which pixel values are wrapped into a predetermined range α. The phase unwrapping section performs a phase unwrapping process to the differential phase image. The statistical operation section obtains a mode from statistical operation of pixel values in each subregion segmented in the unwrapped differential phase image. Each subregion is a unit in which error caused by the phase unwrapping process is to be corrected. The correction processing section calculates, for each pixel, an integer 'n' which allows a difference Δ between the mode and a pixel value of each pixel to satisfy nα−α/2≦Δ<nα+α/2, and subtracts n·α from each pixel value.


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