The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2015

Filed:

Mar. 28, 2014
Applicant:

Wd Media, Llc, San Jose, CA (US);

Inventors:

Mrugesh Desai, San Jose, CA (US);

Harold H. Gee, San Jose, CA (US);

Mark A. Nichols, San Jose, CA (US);

Assignee:

WD Media, LLC, San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 27/36 (2006.01); G11B 20/10 (2006.01);
U.S. Cl.
CPC ...
G11B 27/36 (2013.01); G11B 20/10453 (2013.01);
Abstract

Methods for measuring media performance associated with adjacent track interference are provided. One such method includes iteratively writing data to a target track for each of a plurality of n frequencies, measuring a first signal amplitude and a first noise for each of the n sectors on the target track, writing an aggressor track pattern proximate the target track, measuring a second signal amplitude and a second noise for each of the n sectors on the target track, calculating a weighted sum for each of the signal amplitude measurements for each of the plurality of n frequencies, and calculating a weighted sum for each of the noise measurements for each of the plurality of n frequencies, and repeating the writing the aggressor track pattern, the measuring the second signal amplitude and the second noise, and calculating the weighted sums for preselected numbers of times.


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