The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2015
Filed:
Jun. 17, 2014
Applicant:
Marvell International Ltd., Hamilton, BM;
Inventors:
Heng Tang, San Jose, CA (US);
Panu Chaichanavong, Bangkok, TH;
Gregory Burd, San Jose, CA (US);
Yu-Yao Chang, Sunnyvale, CA (US);
Assignee:
Marvell International Ltd., Hamilton, BM;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 5/02 (2006.01); G11B 27/36 (2006.01); G11B 20/10 (2006.01);
U.S. Cl.
CPC ...
G11B 20/10009 (2013.01);
Abstract
Systems and methods are provided for evaluating an asymmetry metric. A receiver receives a synchronization signal, a filtered signal, and a reference signal. A processor processes the synchronization signal and the reference signal to obtain a peak indicator signal, identifies a first set of values and a second set of values from the filtered signal based at least in part on the peak indicator signal, and evaluates an asymmetry metric from the first set of values and the second set of values.