The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2015
Filed:
Mar. 28, 2011
Thomas Ertl, Florstadt, DE;
Raimund Hibst, Erbach, DE;
Karl Stock, Eilwangen, DE;
Rainer Graser, Ulm, DE;
Michael Zint, Ulm, DE;
Thomas Ertl, Florstadt, DE;
Raimund Hibst, Erbach, DE;
Karl Stock, Eilwangen, DE;
Rainer Graser, Ulm, DE;
Michael Zint, Ulm, DE;
Degudent GmbH, Hanau, DE;
Abstract
The invention relates to a method for ascertaining material characteristics of an object, in particular optical properties of preferably semi-transparent objects. The aim of the invention is to obtain material characteristics without complex measuring methods. This is achieved in that spectrally resolved data from measured data of the object are calculated with spectrally resolved data of a reference body in order to ascertain the material characteristics, the measured data being ascertained with a confocal 3D measuring system.