The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2015
Filed:
Jan. 30, 2012
Applicants:
Eric Moore, Boulder, CO (US);
Robert Mcleod, Boulder, CO (US);
Inventors:
Eric Moore, Boulder, CO (US);
Robert McLeod, Boulder, CO (US);
Assignee:
The Regents of the University of Colorado, a body corporate, Denver, CO (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 9/02 (2006.01); G01S 7/491 (2006.01); G01S 17/32 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02091 (2013.01); G01B 9/02004 (2013.01); G01B 9/02044 (2013.01); G01B 9/0207 (2013.01); G01S 7/4915 (2013.01); G01S 17/325 (2013.01); G01B 2290/70 (2013.01);
Abstract
Interferometric path length measurements using frequency-domain interferometry form the basis of several measurement techniques, including optical frequency domain reflectometry (OFDR), optical coherence tomography (OCT), and frequency-modulated continuous wave (FMCW) radar and lidar. A phase-sensitive and self-referenced approach to frequency-domain interferometry yields absolute and relative path length measurements with axial precision orders of magnitude better than the transform-limited axial resolution of the system.