The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2015
Filed:
Dec. 08, 2010
Applicant:
Yusuke Hirao, Takatsuki, JP;
Inventor:
Yusuke Hirao, Takatsuki, JP;
Assignee:
Konica Minolta Holdings, Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01J 3/453 (2006.01); G01J 3/02 (2006.01);
U.S. Cl.
CPC ...
G01J 3/4535 (2013.01); G01J 3/02 (2013.01); G01J 3/0208 (2013.01); G01J 3/021 (2013.01); G01J 3/027 (2013.01);
Abstract
Provided is a small, highly accurate Fourier spectrometer which enables highly accurate detection of an optical path difference in an interferometer. An element for changing to a narrow band is provided to return reflected light to a second light source (), and the wavelength of light emitted by the second light source is locked, whereby the position of a movable mirror () is measured highly accurately and an optical path length () and an optical path length () match highly accurately.