The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 2015
Filed:
Jun. 12, 2008
Applicants:
Bruno Mirbach, Konz, DE;
Romuald Ginhoux, Cannes la Bocca, FR;
Inventors:
Bruno Mirbach, Konz, DE;
Romuald Ginhoux, Cannes la Bocca, FR;
Assignee:
IEE International Electronics & Engineering S.A., Luxembourg, LU;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G01S 7/497 (2006.01); G01S 17/89 (2006.01); H04N 5/222 (2006.01);
U.S. Cl.
CPC ...
H04N 5/232 (2013.01); G01S 7/497 (2013.01); G01S 17/89 (2013.01); H04N 5/2226 (2013.01); G01S 2007/4975 (2013.01);
Abstract
A method for contamination detection in a time-of-flight (TOF) range imaging system is described, wherein the TOF range imaging system receives light reflected from a scene, through an optical interface, on an imager sensor having an array of pixels, and wherein distance information and amplitude information are determined for the sensor pixels. The presence of contamination on the optical interface is determined on the basis of amplitude information determined for the sensor pixels.