The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 2015

Filed:

Dec. 16, 2013
Applicant:

Marvell International Ltd., Hamiliton, BM;

Inventors:

Adam George, Austin, TX (US);

Bradley C. Aldrich, Austin, TX (US);

Ping-Sing Tsai, Cedar Park, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 9/64 (2006.01); H04N 5/217 (2011.01); G06T 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/002 (2013.01);
Abstract

An apparatus, method, and other embodiments associated with performing interpolations to compute gain values that correct for varying spatial intensity are described. In one embodiment, a method includes determining, by an apparatus that processes image data, a gain value for a pixel in the image data for which there is no gain value available in the apparatus, by interpolating related gain values associated with corners of a rectangle bounding the pixel, wherein the interpolating includes determining at least two partial coefficients by interpolating pairs of the related gain values. Noise is filtered from the image data using a noise threshold, and the noise threshold is modified by using the at least two partial coefficients. The method also applies the gain value to the pixel in the image data.


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